As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...

Production testing for complex chips usually involves multiple test methods. Scan-based automatic test pattern generation (ATPG) for the stuck-at defect model has been the standard for many years, but ...

Watch the video below, where Lee Harrison – Director of Automotive IC Solutions at Siemens EDA – explains the technology behind full In-System ATPG testing for advanced semiconductors Continuous ...

Today's leading-edge system-on-chip (SoC) designs typically have multiple clock domains and, in many cases, multiple internally generated clocks. In test mode, those clocks may be combined into one, ...