Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

The government’s go ahead to parallel testing of electronics products, starting with a pilot on mobile phones, will offer a “significant relief” to the ICT (information and communications technology) ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

Products of electronics and mobile manufacturers like Samsung, Apple, Xiaomi, Lenovo, Dell, boAt, among others, can now reach the market faster as the government has allowed parallel testing of 64 ...

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

NEW DELHI: The Centre’s move to allow parallel testing instead of the presently prevalent sequential testing for electronics hardware products will reduce time-to-market and improve the ease of doing ...

Semiconductor testing solutions developer Cosmic is making its global debut at PCIM Expo. The company will showcase its ...